SePL – Secure e-Portal Logon
An enterprise information portal (e-portal) is a single gateway through which to gain access to all the information, data, systems, and processes used by an
organization’s employees, customers, investors, or business partners. The user's experience of the e-portal is uniquely tailored to his or her individual needs,
and the user can access the e-portal via the corporate intranet (usually employees only), extranets, or the Internet.
Secure e-Portal Log-on (SePL) from Applied Biometrics is a utility for enhancing e-portal security with a secure biometric log-on. Currently e-Portal systems which have implemented biometrics only use single fingerprint authentication. SePL uses the Applied Biometrics BiometricPIN™ - a sequence of fingerprints; to increase the security and provide the users with an ability to change their sequence (PIN) like they can do with a password. In this way SePL addresses the privacy concerns associated with biometric systems.
The first implementation of SePL is for the Tomcat web server - the world’s most popular and best supported open-source Apache HTTP web server engine. A BiometricPIN™ is used for the initial high security access to the system. Once authenticated, the user rights and roles associated with that BiometricPIN™ are used to provide access to the required service.
- User logon attempt using BiometricPIN™
- Compare biometric sequence, find match
- Return role and access rights associated directly with BiometricPIN™
- Access required service
Major Benefits of SePL
- Provides enhanced security by the SePL biometric authentication replacing an insecure password log-on
- Removes the need for the user to remember complex alphanumeric passwords
- Maintains individuals’ privacy and security over single fingerprint systems as users can change their BiometricPIN™ sequence
- Allows varying levels of security to be applied to different applications
- Provides accurate fingerprint recognition
- Simple and easy to use login procedure
- Reduces password administration costs
